1) P. A. Rosenthal, E. T. Yu, P. J. Zampardi, D. P. Pivin, J. W. Mayer,
W. Mcneil, B. Howard, and H. Walker, "Characterization of structural and
electronic properties of semiconductors using cross-sectional scanning
force microscopy," University of California San Diego, La Jolla, CA. July
26, 2000.
| Abstract (HTML) | Presentation PDF (1.74 MB) |
2) P. A. Rosenthal, E. T. Yu, and P. J. Zampardi, "Structural and electronic
properties of AlxGa1-xAs/GaAs heterojunction bipolar
transistors characterized using cross-sectional scanning force microscopy,"
42nd Electronic Materials Conference (2000), University of Denver, Denver,
CO. June 22, 2000.
| Abstract (HTML) | Presentation PDF (307 kB) |
3) P. A. Rosenthal, E. T. Yu, D. P. Pivin, and J. W. Mayer, "Scanning capacitance microscopy study of focused ion beam implanted silicon," Arizona State University Focused Ion Beam Facility Research Review, Tempe, AZ. June 16, 2000. Invited.
4) P. A. Rosenthal, and E. T. Yu, "Two-dimensional dopant profiling using
scanning probe microscopy techniques," University of California San Diego,
La Jolla, CA. December 15, 1998.
| Abstract (HTML) | Presentation PDF (520 kB) |
5) P. A. Rosenthal, E. T. Yu, R. L. Pierson and P. J. Zampardi, "Cross-sectional
Kelvin probe force microscopy of epitaxial layers for heterojunction
bipolar transistors," 40th Electronic Materials Conference (1998), University
of Virginia, Charlottesville, VA. June 24, 1998.
| Abstract (HTML) | Presentation PDF (498 kB) |
6) P. A. Rosenthal, and B. London, "Hot-workability study of fine-grained
iron-nickel based superalloys," Rockwell International Science Center,
Thousand Oaks, CA. May 24, 1996.
| Abstract (HTML) | Presentation PDF (335 kB) |
7) P. A. Rosenthal, and J. Lain, "Statistical process control of wave
solder and aqueous cleaning procedures," Solectron Corporation, Milpitas,
CA. August 16, 1995.